Basic understanding of silicon test

[doobeeyah]

Hi,

I am looking for articles or writing that talk about basic theory of
CMOS
testing that I can read and understand. I am taking electronic courses
now and would like to get a job as a semiconductor test engineer.

Take for example the basic continuity test of the protection diodes
for an input pin. I'd like to know what does it mean by failing Open
or Short or Leakage
and specifically what is happening to the device when these tests are
performed.
As well, I'd like to know what is being forced (voltage/current) and
what
should be expected.

Can some kind person please recommend a site or books I can read up
please?

Thanks for your help.

 

[Hrh]

There are two good books which will give you a picture
of Semiconductor Testing:

1) Essentials of Electronic Testing for Digital, Memory, and
Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing
Volume 17)
by Michael L. Bushnell, Vishwani D. Agrawal, Michael J. Bushnell

2) Digital Systems Testing and Testable Design
by Miron Abramovici, Arthur D. Friedman (Editor), Melvin A. Breuer (Editor)

The 1st, is more uptodate, less mathematical, and newer. The 2nd
is older, more depth, more math.

Good luck.

doobeeyah@hotmail.com (doobeeyah) wrote in message news:<fad39b9.0403041518.1cf0957c@posting.google.com>...

Hi,

I am looking for articles or writing that talk about basic theory of
CMOS
testing that I can read and understand. I am taking electronic courses
now and would like to get a job as a semiconductor test engineer.

Take for example the basic continuity test of the protection diodes
for an input pin. I'd like to know what does it mean by failing Open
or Short or Leakage
and specifically what is happening to the device when these tests are
performed.
As well, I'd like to know what is being forced (voltage/current) and
what
should be expected.

Can some kind person please recommend a site or books I can read up
please?

Thanks for your help.